Proposals can now be submitted for EMBL Hamburg beamtime and facilities in 2016.

Status of the beamline as of 28 October 2014

  • Beam: P14 offers micro-beam conditions with a beam-size of 5 x 5 micron2 (V x H) and divergence below 0.3 mrad. For large crystals, the unfocused beam with a maximum size of 300 micron can be used. Moving between unfocused, half-focused, and fully focused beam conditions can be controlled easily via the user interface and takes less than 20 secs. Typical crystal life times are between 0.5 secs (5 x 5 micron2 beam with 5 x 1012 ph/sec @ 12 keV) and 30 min. (300 micron beam with 1012 ph/sec)
  • Energy tunability: The beamline is tunable between 6 and 20 keV (2.1 and 0.6 A). Fluorescence spectra can be recorded with an AMPTEK silicon drift detector.
  • Diffractometer: The diffractometer is an MD3 instrument with the spindle axis mounted in a vertical and downward configuration (including a mini-kappa goniostat). This instrument has a sphere of confusion smaller than 100 nm when the mini-kappa goniostat is mounted. Three-click centring and continuous '4D'-scans between two centring points are available.
  • In situ datacollection: Diffraction data can be collected from crystals in CrystalDirectTM plates.
  • Detector: PILATUS 6M (25 Hz, 450 micron sensor thickness) for shutter-less oscillation data collection.
  • User Interface: The user interacts with the beamline via the Hamburg-version of mxCuBE v2 (ESRF) user interface.
  • Sample mounting: For the time being, crystals have to be mounted manually. However, mounting from SPINE-vials is rather convenient due to the vertical/downward orientation of the spindle axis. 
  • Data processing: An 40 CPU linux-server is available for data-processing with XDS.
  • Data storage and archival: Data will be stored on local servers for 1 month. At present, there are no facilities for data archival. Users are asked to bring their own back-up media (USB 2 or USB 3) for data archival.
  • Structure determination: The autoRickshaw and hkl2map pipelines for structure solution are available.
  • Ancillary facilities: A lab specifically designed and equipped for preparing derivatized crystals is accessible upon request.

Typical experiments presently possible

  • Collection of native data on crystals with minimum dimension of 5 micron.
  • Collection of high-multiplicity anomalous data using different kappa-settings.
  • Crystal characterization with beam sizes between 5 and 300 micron.
  • Continuous helical data collection ('4d'-scan) on long crystals.
  • Serial crystallography (see Gati et al. (2014) IUCrJ 1:87).

Next steps

  • 2015 Installation MARVIN crystal mounting robot.
  • 2015 Installation of focusing Compound Refractive Lenses.
  • 2016 Installation of improved X-ray mirror.

Contacts

Beamline Scientist
Gleb Bourenkov
Tel: +49 (0) 40 89902-120
Email: gleb@embl-hamburg.de

MX@PETRA3 coordinator
Thomas R. Schneider
Tel.:+49 (0) 40 89902-111